Provide AOI/Optical Inspection Unit (Inline and Offline) solution to wafer and cell manufacturers
Wafer/Cell Inline/Offline Inspection Unit
In an increasingly competitive market for photovoltaics products the fast and effective inspection of solar cells is an essential criterion to ensure perfect quality at highest possible yield. TWIC honorably present Optical measurement system and its software speed can reach 600 cells/min. and inspection criteria inclues:
Material control Microcracks; Inclusions; Microcrystalline structure; Bending
Geometry inspection Standard and special cell models; Chamfers of any shape; Intrusions and protrusions; Broken corners; Edge and chamfer lengths, diagonals; Secondary measuring points
Alignment by cell geometry or print
Front side inspection Finger interruptions, necks, knots; Busbars, logos; Surface defects between fingers particularly when close to the cell border; Coating / Color
Back side inspection Surface defects; Marker positions; Labels
Values and Benefits
Ease of use Intuitive operation requires no special knowledge
Fast 600 cells/min. and more
for best performance
Good value for money Using standard components
Reliable Robust construction using
Industrial components
Complete Integration of all
functionalities by default
